December 31, 2011
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Electro-thermal atomic force microscope cantilever tip enables new nanometrology. Urbana-Champaign IL, USA — Atomic force microscope cantilever tips with integrated heaters are widely used to characterize polymer films in electronics and optical devices, pharmaceuticals, paints, and coatings. These heated tips are also used in research labs to explore new ideas in nanolithography and data storage, [...]
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December 31, 2011
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Dundalk, Ireland — Every SAT predictive maintenance IR camera comes with SATReport standard software. It is a basic measurement and analysis software to in-depth and precise evaluation of thermal performance. It is a powerful analysis tool for extensive thermal analysis. SATReport standard features everything you need to complete your inspection report. Features include spot and [...]
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