Measuring Temperatures at the Micron Level

Webinar on Infrared Microscopy | September 13 at 1 p.m. US EST

Infrared Microscopy – Measuring Temperatures at the Micron Level
Image Courtesy FLIR Systems, Inc.

Online — In the ever-shrinking world of electronic components, finding and fixing hot spots during electronic systems design and testing is becoming increasingly difficult.

In this brief 20-30 minute webinar on September 13, 2018, FLIR staff will discuss how the use of close-up and microscope lenses allow infrared cameras to make accurate temperature measurements on components less than 25 micron in size and even image targets as small as 3.5 microns.

They will also provide side-by-side comparisons of real-world images and data from a variety of different camera and lens combinations.

Register Today!

Can’t be there live? Don’t worry! Register and Jerry Beeney will send the recording after the event so you can watch at your own convenience.

Contact: Jerry Beeney
FLIR Systems Business Development Manager
Premium Business Segment – Americas

Direct: +1 800 969 1764 – Mobile: +1 978 376 2131
Email: jerry.beeney@flir.com

About FLIR

FLIR Systems, Inc. designs, develops, manufactures, markets, and distributes technologies that enhance perception and awareness. We bring innovative sensing solutions into daily life through our thermal imaging, visible-light imaging, video analytics, measurement and diagnostic, and advanced threat detection systems.

FLIR Systems, Inc.

Website: www.flir.com