Submission deadline extended | SPIE DSS & ThermoSense

Thermosense: Thermal Infrared Applications XXXIII

Abstract due date extended to 8 November.

Share your latest discoveries, build visibility for your work, and get immediate face-to-face feedback from leading experts in the field

SPIE Defense Security & Sensing (DSS)
25 – 29 April 2011
Orlando World Center Marriott Resort & Convention Center
Orlando, Florida,USA

Conference DS101
Part of program track on IR Sensors and Systems

This conference has an open call for papers:

See submission guidelines for Authors & Presenters
Submit an abstract

Conference Chairs
Morteza Safai, The Boeing Co.; Jeff R. Brown, Hope College

Program Committee
Andrea Acosta, Colbert Infrared Services; Nicolas P. Avdelidis, National Technical Univ. of Athens (Greece); Douglas Burleigh, La Jolla Cove Consulting; Fred P. Colbert, Colbert Infrared Services; K. Elliott Cramer, NASA Langley Research Ctr.; Ralph B. Dinwiddie, Oak Ridge National Lab.; Ermanno G. Grinzato, Consiglio Nazionale delle Ricerche (Italy); Sheng-Jen Hsieh, Texas A&M Univ.; Herbert Kaplan, Honeyhill Technical Co.; Timo T. Kauppinen, VTT Technical Research Ctr. of Finland (Finland); Dennis H. LeMieux, Siemens Power Generation, Inc.; Monica Lopez Saenz, IRCAM GmbH (Germany); Xavier P. V. Maldague, Univ. Laval (Canada); Jonathan J. Miles, James Madison Univ.; Gary L. Orlove, FLIR Systems, Inc.; G. Raymond Peacock,, Inc.; Piotr Pregowski, Pregowski Infrared Services (Poland); Ralph A. Rotolante, Movitherm; Andr??s E. Rozlosnik, SI Termograf??a Infrarroja (Argentina); Takahide Sakagami, Kobe Univ. (Japan); Steven M. Shepard, Thermal Wave Imaging, Inc.; Gregory R. Stockton, Stockton Infrared Thermographic Services, Inc.

Steering Committee Emeritus Members: Sven-??ke Ljingberg, Univ. of G??yle (Sweden); John R. Snell, Snell Infrared (United States); Robert Madding, FLIR Systems (United States)

Thermal/infrared related papers are solicited in the areas listed and are also welcome in other areas:

Aerospace Applications

  • NDT and quality control (also see NDT)
  • corrosion/FOD/fatigue
  • aging aircraft
  • spacecraft & satellites Automotive Industry
  • manufacturing – process applications
  • predictive maintenance
  • process monitoring – automation
  • testing, measurement QA, R&R and validation.

Environmental and Resource Monitoring

  • agriculture and water conservation
  • fish and wildlife migration
  • geology
  • pollution and storm water outflow
  • remote detection and environmental sensing.

Food Processing and Agriculture

  • foreign object detection and characterization
  • process monitoring and automation
  • quality control
  • safety.


  • utilities
  • airports and harbors
  • building surveys, historic studies
  • roads and bridges
  • thermal performance of buildings.

IR Image Fusion Applications

  • biological and medical
  • field/security
  • process
  • structural.

Manufacturing and Processing Industries

  • composites industry (also see NDT)
  • glass and ceramics
  • machine vision
  • metals processing
  • petroleum and chemical
  • plastics
  • predictive maintenance applications
  • pulp and paper
  • quality control applications
  • semiconductors and microelectronics.

Materials Evaluation and NDT

  • fatigue analysis
  • sonic IR
  • thermal properties of materials
  • thermal stress analysis (TSA).


  • calibration of IR thermometers
  • screening for human body temperature
  • veterinary applications of IR.


  • resource and maintenance management
  • economic impact, justifications studies
  • equipment, software, and practices guides
  • professionalism, standards, and certification.

NDT (Nondestructive Testing

  • subsurface flaws
  • composite materials and structures
  • metallic structures
  • aerospace applications
  • civil structures (infrastructure)
  • underground anomalies
  • electronic components.

Power Generation and Distribution

  • field measurement issues
  • power plant heat-rate efficiency
  • predictive maintenance
  • safety and records.

Research and Development

  • animal applications
  • enhanced spatial resolution
  • enhanced time resolution
  • image interpretation
  • medical applications
  • microscopy
  • new methods
  • thermal modeling and FEA.


  • disease screening
  • fire and rescue
  • law enforcement
  • surveillance in civilian applications.

In case of multiple submissions, the Program Committee reserves the right to allow only one oral presentation per author group while transferring the others to the poster session. During the Symposium, authors are expected to attend their respective sessions to enable interaction with the audience.

Unless otherwise requested by authors, authors and abstracts will be posted at

Monday Evening Exhibitor Vendor Session
What’s New in Infrared Imaging Hardware and Software
(Presentations by equipment and service vendors)
Moderators: Herbert Kaplan, Honeyhill Technical Co., Andres E. Rozlosnik, SI Termograf??a Infrarroja This session is now in its seventh year and has become very popular. This venue provides an early opportunity for exhibitors to showcase their latest technology and products to the ThermoSense and IR community prior to the opening of the exhibit. This enables the technical conference attendees can to better prioritize their activities when visiting the exhibits. It is a casual meeting with ample time for questions and answers.

Your company must be an exhibitor at DSS11 to be part of this event. If you are interested in participating, or have more questions, please contact:
Herbert Kaplan or Andres Rozlosnik

Student Poster and Poster Briefing Session
Chairs: Jonathan J. Miles, James Madison Univ. and Jeff R. Brown, Hope College

ThermoSense XXXIII will again feature a Student Poster Session. The session is intended to promote awareness of, and encourage undergraduate and graduate research pertaining to, the ThermoSense conference.

The oral sessions are open to students who wish to present their work as a manuscript for oral presentation. In order to take part in the Student Poster Session:
(1) an abstract must be submitted electronically to SPIE via the web on or before the SPIE abstract due date of 11 October 2010 (a Tracking Number will be forwarded after submission); then
(2) the abstract must be e-mailed to the session chair, Jonathan Miles, at with the paper confirmation tracking number (i.e. DSS11-DS101-XX);
(3) the lead author must be a student; and
(4) the student author must commit to attending the symposium and presenting his or her poster.